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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition by Goldstein

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition by Goldstein

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Location: Phoenix, Arizona

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Language : [English]
Item Weight : [72.2 Oz]
Subject : [Materials Science / General, Life Sciences / Biophysics, Electron Microscopes & Microscopy, Microscopes & Microscopy]
Publication Year : [2003]
Publisher : [Springer]
Type : [Textbook]
Format : [Hardcover]
Item Width : [7 in]
Number of Pages : [Xix, 689 Pages]
Publication Name : [Scanning Electron Microscopy and X-Ray Microanalysis]
Item Length : [10 in]
Author : [Eric Lifshin, Joseph Goldstein, David C. Joy, Patrick Echlin, Charles E. Lyman]
Subject Area : [Non-Classifiable, Technology & Engineering, Science]
Features : [Revised]
UPC : [9780306472923]
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text clean, binding tight, edge wear, includes CD, 3rd edition, Springer, hardover, 690 pages, name on front end paper, 
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